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ISPM Meeting and Tutorial

Toronto 2012 is the 14th meeting in a continuing series of international meetings featuring research on scanning probe microscopy (SPM), sensors, and nanostructures that began in Seattle in 1999. The goal of this meeting is to communicate the latest developments and applications of scanning probe microscopy methods. This meeting attracts researchers working in academia, government, and industry. It rotates around the world (USA, Germany, Japan, UK, China, Mexico, France, Korea, Spain) and this year, it is coming to Canada!

In the last 30 years, SPM techniques have revolutionized research and technology developments, furthering progress in materials research, nanotechnology and bionanotechnology. This meeting is dedicated to the discussion of the latest developments in SPM techniques and their applications at the interface of physics, biology, materials sciences and engineering. This year, the emphasis is on bio- and nano-technologies.

The symposium presents an opportunity for the discussion of novel developments and application of SPM methods, providing excellent opportunities to meet leading researchers during formal lectures and informal discussions from June 15-18 accompanied by a 3-day exhibit from leading AFM suppliers.

This year, we offer a one-day tutorial for students, academia, and industry researchers who are interested in learning about AFM from the beginning. The tutorial will be held on June 15th and will include introductory lectures, demonstrations, and discussions with experts in this field.